An area-efficient dual replica-bitline delay technique for process-variation-tolerant low voltage SRAM sense amplifier timing

نویسندگان

  • Yi Li
  • Liang Wen
  • Yuejun Zhang
  • Xu Cheng
  • Jun Han
  • Zhiyi Yu
  • Xiaoyang Zeng
چکیده

A novel area-efficient dual replica-bitline delay technique is proposed in this brief to improve process-variation-tolerance of low voltage SRAM application. This strategy suppresses the timing variation by adding one another replica-bitline and introducing novel replica cell which has the same size as conventional. Simulation results in TSMC 65nm LP technology show that more than 32.3% timing variation is reduced and 18% cycle time is saved at low supply voltage without any area overhead.

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عنوان ژورنال:
  • IEICE Electronic Express

دوره 11  شماره 

صفحات  -

تاریخ انتشار 2014